APA (7th ed.) Citation

Bright, A. N., & Humphreys, C. J. (2001). Identification of interfacial layers in Ohmic contacts to n-type GaN and Al [sub x] Ga[sub 1– x] N/GaN heterostructures using high-resolution electron microscopy. Philosophical Magazine B, 81(11), 1725. https://doi.org/10.1080/13642810110079962

Chicago Style (17th ed.) Citation

Bright, A. N., and C. J. Humphreys. "Identification of Interfacial Layers in Ohmic Contacts to N-type GaN and Al [sub X] Ga[sub 1– X] N/GaN Heterostructures Using High-resolution Electron Microscopy." Philosophical Magazine B 81, no. 11 (2001): 1725. https://doi.org/10.1080/13642810110079962.

MLA (9th ed.) Citation

Bright, A. N., and C. J. Humphreys. "Identification of Interfacial Layers in Ohmic Contacts to N-type GaN and Al [sub X] Ga[sub 1– X] N/GaN Heterostructures Using High-resolution Electron Microscopy." Philosophical Magazine B, vol. 81, no. 11, 2001, p. 1725, https://doi.org/10.1080/13642810110079962.