Identification of interfacial layers in Ohmic contacts to n-type GaN and Al [sub x] Ga[sub 1– x] N/GaN heterostructures using high-resolution electron microscopy.
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| Title: | Identification of interfacial layers in Ohmic contacts to n-type GaN and Al [sub x] Ga[sub 1– x] N/GaN heterostructures using high-resolution electron microscopy. |
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| Authors: | Bright, A. N., Humphreys, C. J. |
| Source: | Philosophical Magazine B. 11/1/2001, Vol. 81 Issue 11, p1725-1744. 20p. |
| Database: | Academic Search Ultimate |
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