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Influence of base resistance on extracting thermal resistance for SiGe HBTs.

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Title: Influence of base resistance on extracting thermal resistance for SiGe HBTs.
Authors: Han, Bo1, Zhou, Tianshu2, Xu, Xiangming2, Li, Pingliang2, Gao, Jianjun1,3
Source: International Journal of RF & Microwave Computer-Aided Engineering. May2012, Vol. 22 Issue 3, p353-358. 6p. 1 Diagram, 1 Chart, 9 Graphs.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 74104399
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+RF+%26+Microwave+Computer-Aided+Engineering%22">International Journal of RF & Microwave Computer-Aided Engineering</searchLink>. May2012, Vol. 22 Issue 3, p353-358. 6p. 1 Diagram, 1 Chart, 9 Graphs.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=74104399
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        Value: 10.1002/mmce.20606
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 353
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            NameFull: Han, Bo
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            NameFull: Zhou, Tianshu
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            NameFull: Xu, Xiangming
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            NameFull: Li, Pingliang
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              Text: May2012
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              Y: 2012
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              Value: 22
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