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Structural properties of silicon epitaxy grown at 200–600 °C by electron-beam evaporation in an ultrahigh vacuum system.

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Title: Structural properties of silicon epitaxy grown at 200–600 °C by electron-beam evaporation in an ultrahigh vacuum system.
Authors: Yew, Tri-Rung, Lin, Yung-Jen, Shieh, Ming-Deng, Chen, Cheng-Hsien
Source: Journal of Applied Physics. 5/15/1993, Vol. 73 Issue 10, p4932. 5p. 14 Black and White Photographs, 1 Graph.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 7634731
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Structural properties of silicon epitaxy grown at 200–600 °C by electron-beam evaporation in an ultrahigh vacuum system.
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  Label: Authors
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  Data: <searchLink fieldCode="AR" term="%22Yew%2C+Tri-Rung%22">Yew, Tri-Rung</searchLink><br /><searchLink fieldCode="AR" term="%22Lin%2C+Yung-Jen%22">Lin, Yung-Jen</searchLink><br /><searchLink fieldCode="AR" term="%22Shieh%2C+Ming-Deng%22">Shieh, Ming-Deng</searchLink><br /><searchLink fieldCode="AR" term="%22Chen%2C+Cheng-Hsien%22">Chen, Cheng-Hsien</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>. 5/15/1993, Vol. 73 Issue 10, p4932. 5p. 14 Black and White Photographs, 1 Graph.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=7634731
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1063/1.353811
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 4932
    Titles:
      – TitleFull: Structural properties of silicon epitaxy grown at 200–600 °C by electron-beam evaporation in an ultrahigh vacuum system.
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            NameFull: Yew, Tri-Rung
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            NameFull: Lin, Yung-Jen
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            NameFull: Shieh, Ming-Deng
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            NameFull: Chen, Cheng-Hsien
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            – D: 15
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              Text: 5/15/1993
              Type: published
              Y: 1993
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              Value: 00218979
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              Value: 73
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              Value: 10
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            – TitleFull: Journal of Applied Physics
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