The high-temperature stability of chemically vapor-deposited tungsten-silicon couples rapid thermal annealed in ammonia and argon.

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Bibliographic Details
Title: The high-temperature stability of chemically vapor-deposited tungsten-silicon couples rapid thermal annealed in ammonia and argon.
Authors: Broadbent, E. K., Morgan, A. E., Flanner, J. M., Coulman, B., Sadana, D. K., Burrow, B. J., Ellwanger, R. C.
Source: Journal of Applied Physics. 12/15/1988, Vol. 64 Issue 12, p6721. 6p.
Database: Academic Search Ultimate
Description
ISSN:00218979
DOI:10.1063/1.342003