Depth profiling of oxygen in oxide films by O(p,α)N nuclear reaction analysis.

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Bibliographic Details
Title: Depth profiling of oxygen in oxide films by O(p,α)N nuclear reaction analysis.
Authors: Reddy, G.1, Rao, Pritty1, Ramana, J.1, Vikramkumar, S.1, Raju, V.1, Kumar, Sanjiv1 sanjucccm@rediffmail.com
Source: Journal of Radioanalytical & Nuclear Chemistry. Dec2012, Vol. 294 Issue 3, p401-404. 4p. 5 Graphs.
Database: Academic Search Ultimate
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