View in EDS PDF Full Text

Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology.

Saved in:
Bibliographic Details
Title: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology.
Authors: Cavrić, Bojan1, Dolićanin, Edin2, Petronijević, Predrag2, Pejović, Milić3, Stanković, Koviljka2 kstankovic@etf.rs
Source: International Journal of Photoenergy. 2013, p1-7. 7p.
Database: Academic Search Ultimate
Description
ISSN:1110662X
DOI:10.1155/2013/158792