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Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology.

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Title: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology.
Authors: Cavrić, Bojan1, Dolićanin, Edin2, Petronijević, Predrag2, Pejović, Milić3, Stanković, Koviljka2 kstankovic@etf.rs
Source: International Journal of Photoenergy. 2013, p1-7. 7p.
Database: Academic Search Ultimate
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PubType: Academic Journal
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  Data: <searchLink fieldCode="AR" term="%22Cavrić%2C+Bojan%22">Cavrić, Bojan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Dolićanin%2C+Edin%22">Dolićanin, Edin</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Petronijević%2C+Predrag%22">Petronijević, Predrag</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Pejović%2C+Milić%22">Pejović, Milić</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Stanković%2C+Koviljka%22">Stanković, Koviljka</searchLink><relatesTo>2</relatesTo><i> kstankovic@etf.rs</i>
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Photoenergy%22">International Journal of Photoenergy</searchLink>. 2013, p1-7. 7p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=95031843
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        Value: 10.1155/2013/158792
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        Text: English
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              Text: 2013
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