APA (7th ed.) Citation

Gajewski, K., Kopiec, D., Moczała, M., Piotrowicz, A., Zielony, M., Wielgoszewski, G., . . . Strupiński, W. (2015). Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate. Micron, 68, 17. https://doi.org/10.1016/j.micron.2014.08.005

Chicago Style (17th ed.) Citation

Gajewski, Krzysztof, Daniel Kopiec, Magdalena Moczała, Adam Piotrowicz, Michał Zielony, Grzegorz Wielgoszewski, Teodor Gotszalk, and Włodek Strupiński. "Scanning Probe Microscopy Investigations of the Electrical Properties of Chemical Vapor Deposited Graphene Grown on a 6H-SiC Substrate." Micron 68 (2015): 17. https://doi.org/10.1016/j.micron.2014.08.005.

MLA (9th ed.) Citation

Gajewski, Krzysztof, et al. "Scanning Probe Microscopy Investigations of the Electrical Properties of Chemical Vapor Deposited Graphene Grown on a 6H-SiC Substrate." Micron, vol. 68, 2015, p. 17, https://doi.org/10.1016/j.micron.2014.08.005.