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Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate.

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Title: Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate.
Authors: Gajewski, Krzysztof1 krzysztof.gajewski@pwr.edu.pl, Kopiec, Daniel1, Moczała, Magdalena1, Piotrowicz, Adam1, Zielony, Michał1, Wielgoszewski, Grzegorz1, Gotszalk, Teodor1, Strupiński, Włodek2
Source: Micron. Jan2015, Vol. 68, p17-22. 6p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 99898726
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate.
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  Data: <searchLink fieldCode="JN" term="%22Micron%22">Micron</searchLink>. Jan2015, Vol. 68, p17-22. 6p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=99898726
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1016/j.micron.2014.08.005
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      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 17
    Titles:
      – TitleFull: Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate.
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            NameFull: Gajewski, Krzysztof
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            NameFull: Kopiec, Daniel
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            NameFull: Moczała, Magdalena
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            NameFull: Piotrowicz, Adam
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            NameFull: Zielony, Michał
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            NameFull: Wielgoszewski, Grzegorz
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            NameFull: Gotszalk, Teodor
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            NameFull: Strupiński, Włodek
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              Text: Jan2015
              Type: published
              Y: 2015
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              Value: 09684328
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              Value: 68
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            – TitleFull: Micron
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