Slomovitz, D., Van Moer, W., & Tellini, B. (2015). Guest Editorial: Special Issue on the 2014 IEEE International Instrumentation and Measurement Technology Conference. IEEE Transactions on Instrumentation & Measurement, 64(5), 1098. https://doi.org/10.1109/TIM.2015.2413531
Chicago Style (17th ed.) CitationSlomovitz, Daniel, Wendy Van Moer, and Bernardo Tellini. "Guest Editorial: Special Issue on the 2014 IEEE International Instrumentation and Measurement Technology Conference." IEEE Transactions on Instrumentation & Measurement 64, no. 5 (2015): 1098. https://doi.org/10.1109/TIM.2015.2413531.
MLA (9th ed.) CitationSlomovitz, Daniel, et al. "Guest Editorial: Special Issue on the 2014 IEEE International Instrumentation and Measurement Technology Conference." IEEE Transactions on Instrumentation & Measurement, vol. 64, no. 5, 2015, p. 1098, https://doi.org/10.1109/TIM.2015.2413531.