Guest Editorial: Special Issue on the 2014 IEEE International Instrumentation and Measurement Technology Conference.

Saved in:
Bibliographic Details
Title: Guest Editorial: Special Issue on the 2014 IEEE International Instrumentation and Measurement Technology Conference.
Authors: Slomovitz, Daniel1, Van Moer, Wendy1, Tellini, Bernardo1
Source: IEEE Transactions on Instrumentation & Measurement. May2015, Vol. 64 Issue 5, p1098-1099. 2p.
Database: Business Source Ultimate
Be the first to leave a comment!
You must be logged in first