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Enhanced Self-Test and Fault Localization in VLSI Circuit Using a 32-bit LFSR.

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Title: Enhanced Self-Test and Fault Localization in VLSI Circuit Using a 32-bit LFSR.
Authors: Saradhi, Pardha1, Serina, M. Tiny1, Sravya, K. Sai1, Pavithra, M.1, Ankitha, P.1
Source: International Scientific Journal of Engineering & Management. Apr2025, Vol. 4 Issue 4, p1-6. 6p.
Database: Business Source Ultimate
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  Data: <searchLink fieldCode="JN" term="%22International+Scientific+Journal+of+Engineering+%26+Management%22">International Scientific Journal of Engineering & Management</searchLink>. Apr2025, Vol. 4 Issue 4, p1-6. 6p.
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        Value: 10.55041/ISJEM02744
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        Text: English
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              Text: Apr2025
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