Knowledge-graph-enhanced disturbance control in manufacturing systems: a state-of-the-art review.

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Title: Knowledge-graph-enhanced disturbance control in manufacturing systems: a state-of-the-art review.
Authors: Pei, Fengque1,2 (AUTHOR), Jiang, Ruirui1 (AUTHOR), Zhuang, Cunbo2,3 (AUTHOR) zhuangdavid@bit.edu.cn, Liu, Jianhua2,3 (AUTHOR), Yuan, Minghai1 (AUTHOR)
Source: International Journal of Computer Integrated Manufacturing. Jul2026, Vol. 39 Issue 7, p1009-1035. 27p.
Database: Business Source Ultimate
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An: 195034243
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  Data: Knowledge-graph-enhanced disturbance control in manufacturing systems: a state-of-the-art review.
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  Data: <searchLink fieldCode="AR" term="%22Pei%2C+Fengque%22">Pei, Fengque</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jiang%2C+Ruirui%22">Jiang, Ruirui</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhuang%2C+Cunbo%22">Zhuang, Cunbo</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<i> zhuangdavid@bit.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Liu%2C+Jianhua%22">Liu, Jianhua</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yuan%2C+Minghai%22">Yuan, Minghai</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Computer+Integrated+Manufacturing%22">International Journal of Computer Integrated Manufacturing</searchLink>. Jul2026, Vol. 39 Issue 7, p1009-1035. 27p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=bsu&AN=195034243
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1080/0951192X.2025.2509324
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      – Code: eng
        Text: English
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        PageCount: 27
        StartPage: 1009
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      – TitleFull: Knowledge-graph-enhanced disturbance control in manufacturing systems: a state-of-the-art review.
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            NameFull: Pei, Fengque
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            NameFull: Jiang, Ruirui
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            NameFull: Zhuang, Cunbo
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            NameFull: Liu, Jianhua
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            NameFull: Yuan, Minghai
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            – D: 01
              M: 07
              Text: Jul2026
              Type: published
              Y: 2026
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