APA (7th ed.) Citation

Albin, S. L., & Friedman, D. J. (1989). THE IMPACT OF CLUSTERED DEFECT DISTRIBUTIONS IN IC FABRICATION. Management Science (INFORMS), 35(9), 1066. https://doi.org/10.1287/mnsc.35.9.1066

Chicago Style (17th ed.) Citation

Albin, Susan L., and David J. Friedman. "THE IMPACT OF CLUSTERED DEFECT DISTRIBUTIONS IN IC FABRICATION." Management Science (INFORMS) 35, no. 9 (1989): 1066. https://doi.org/10.1287/mnsc.35.9.1066.

MLA (9th ed.) Citation

Albin, Susan L., and David J. Friedman. "THE IMPACT OF CLUSTERED DEFECT DISTRIBUTIONS IN IC FABRICATION." Management Science (INFORMS), vol. 35, no. 9, 1989, p. 1066, https://doi.org/10.1287/mnsc.35.9.1066.