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THE IMPACT OF CLUSTERED DEFECT DISTRIBUTIONS IN IC FABRICATION.

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Title: THE IMPACT OF CLUSTERED DEFECT DISTRIBUTIONS IN IC FABRICATION.
Authors: Albin, Susan L.1, Friedman, David J.1
Source: Management Science (INFORMS). Sep89, Vol. 35 Issue 9, p1066-1078. 13p.
Database: Business Source Ultimate
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PubType: Academic Journal
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        Value: 10.1287/mnsc.35.9.1066
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        Text: English
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        StartPage: 1066
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              Text: Sep89
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