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National Semiconductor Metrology Program travels roadmap to future needs.

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Title: National Semiconductor Metrology Program travels roadmap to future needs.
Authors: Savage, Lorraine
Source: Solid State Technology. Dec96, Vol. 39 Issue 12, p46. 3p. 2 Charts.
Database: Business Source Ultimate
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PubType: Academic Journal
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        Text: English
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      – TitleFull: National Semiconductor Metrology Program travels roadmap to future needs.
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              Text: Dec96
              Type: published
              Y: 1996
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