Bibliographic Details
| Title: |
EFFECTS OF DIRECT FLUORINATION ON SURFACE CONDUCTIVITY OF EPOXY RESIN INSULATORS. |
| Authors: |
LIU, YAQIANG1,2, LI, LIQIANG1 |
| Source: |
Surface Review & Letters. Dec2014, Vol. 21 Issue 6, p-1. 7p. 1 Black and White Photograph, 1 Diagram, 1 Chart, 4 Graphs. |
| Subjects: |
Epoxy insulators, Fluorination, Surface conductivity, Surface potential, Attenuated total reflectance, Scanning electron microscopy, Surface chemistry |
| Abstract: |
Epoxy resin samples were surface fluorinated using a 2/2 mixture at different temperatures of 25°C, 55°C, 75°C, and 95°C for the same time. Attenuated total reflection infrared (ATR-IR) analyses indicate substantial changes in surface chemical composition and structure by the fluorinations. Scanning electron microscope (SEM) observations show an increase in thickness of the fluorinated layer and a change in its surface morphology with fluorination temperature. Conductivity measurements reveal a large increase in surface conductivity and surface potential measurements consistently show a low initial surface potential and rapid potential decay after corona charging, strongly depending on fluorination temperature and environmental humidity. The initial surface potential was found to decrease dramatically above a critical surface conductivity and almost to zero when surface conductivity increased to 10-12 S. Surface polarity of the epoxy sample was found to dramatically increase with fluorination temperature. An increase in the degree of chain scission with fluorination temperature is considered to be the main cause for the increases of surface conductivity and surface polarity. [ABSTRACT FROM AUTHOR] |
|
Copyright of Surface Review & Letters is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |