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Fabrication and characterization of field emission points for ion production in Penning trap applications.

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Title: Fabrication and characterization of field emission points for ion production in Penning trap applications.
Authors: Redshaw, Matthew1,2 redsh1m@cmich.edu, Benjamin, Anne L.3, Bollen, Georg1,4, Ferrer, Rafael1, Lincoln, David L.1,4, Ringle, Ryan1, Schwarz, Stefan1, Valverde, Adrian A.1,4
Source: International Journal of Mass Spectrometry. Mar2015, Vol. 379, p187-193. 7p.
Subjects: Cathodes, Field emission, Electrons, Penning traps, Mass spectrometry
Abstract: A series of cold cathode field emission points to be used for electron impact ionization of background gas in Penning trap mass spectrometry applications have been fabricated by electrochemically etching tungsten rod in a NaOH solution. A new variation of the drop-off etching method that can produce tips with tip radii down to 10 nm is described. We present the results of studies in which the parameters used in the etching process were varied, and the geometry and operation of the resulting tips was investigated by imaging them with a scanning electron microscope and by operating them in field emission mode. Finally, the use of these tips in a Penning trap mass spectrometry application is described. [ABSTRACT FROM AUTHOR]
Copyright of International Journal of Mass Spectrometry is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 102074548
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Fabrication and characterization of field emission points for ion production in Penning trap applications.
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Mass+Spectrometry%22">International Journal of Mass Spectrometry</searchLink>. Mar2015, Vol. 379, p187-193. 7p.
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  Data: <searchLink fieldCode="DE" term="%22Cathodes%22">Cathodes</searchLink><br /><searchLink fieldCode="DE" term="%22Field+emission%22">Field emission</searchLink><br /><searchLink fieldCode="DE" term="%22Electrons%22">Electrons</searchLink><br /><searchLink fieldCode="DE" term="%22Penning+traps%22">Penning traps</searchLink><br /><searchLink fieldCode="DE" term="%22Mass+spectrometry%22">Mass spectrometry</searchLink>
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  Data: A series of cold cathode field emission points to be used for electron impact ionization of background gas in Penning trap mass spectrometry applications have been fabricated by electrochemically etching tungsten rod in a NaOH solution. A new variation of the drop-off etching method that can produce tips with tip radii down to 10 nm is described. We present the results of studies in which the parameters used in the etching process were varied, and the geometry and operation of the resulting tips was investigated by imaging them with a scanning electron microscope and by operating them in field emission mode. Finally, the use of these tips in a Penning trap mass spectrometry application is described. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of International Journal of Mass Spectrometry is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=102074548
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        Value: 10.1016/j.ijms.2015.01.006
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      – SubjectFull: Electrons
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