Methods and Instruments for the Measurement of the Characteristics of a Background-Target Environment.
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| Title: | Methods and Instruments for the Measurement of the Characteristics of a Background-Target Environment. |
|---|---|
| Authors: | Butuzov, V.1, Skvortsov, B.2 skvortsovb@mail.ru, Pertsovich, A.1, Ershova, T.1, Nosikov, V.1 |
| Source: | Measurement Techniques. Mar2015, Vol. 57 Issue 12, p1365-1370. 6p. |
| Subjects: | Optoelectronic devices, Microresonators (Optoelectronics), Laser cavity resonators, Lasers, Temperature lapse rate |
| Abstract: | A special optoelectronic measuring and recording instrument with fully developed procedural and metrological base for use in determining the optical characteristics of standard moving and stationary objects that emit and reflect light in the ultraviolet and down to the far-infrared regions of the spectrum is considered. Results of experimental studies of the background-target characteristics of different objects for the spectral range 0.2-15 μm are presented. [ABSTRACT FROM AUTHOR] |
| Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 102103706 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=102103706 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11018-015-0636-z Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 1365 Subjects: – SubjectFull: Optoelectronic devices Type: general – SubjectFull: Microresonators (Optoelectronics) Type: general – SubjectFull: Laser cavity resonators Type: general – SubjectFull: Lasers Type: general – SubjectFull: Temperature lapse rate Type: general Titles: – TitleFull: Methods and Instruments for the Measurement of the Characteristics of a Background-Target Environment. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Butuzov, V. – PersonEntity: Name: NameFull: Skvortsov, B. – PersonEntity: Name: NameFull: Pertsovich, A. – PersonEntity: Name: NameFull: Ershova, T. – PersonEntity: Name: NameFull: Nosikov, V. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: Mar2015 Type: published Y: 2015 Identifiers: – Type: issn-print Value: 05431972 Numbering: – Type: volume Value: 57 – Type: issue Value: 12 Titles: – TitleFull: Measurement Techniques Type: main |
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