Bibliographic Details
| Title: |
Universal trimming of polymer thick film resistors. |
| Authors: |
Rambabu, Busi1, Rao, Y. Srinivasa1 |
| Source: |
Microelectronics International. 2015, Vol. 32 Issue 2, p45-51. 7p. |
| Subjects: |
Polymer films, Cutting (Materials), Electric resistors, Polyvinyl chloride, High voltages, Electric resistance |
| Abstract: |
Purpose – The purpose of this paper is to study high-voltage interactions in polymer thick-film resistors, namely, polyvinyl chloride (PVC)-graphite thick-film resistors, and their applications in universal trimming of these resistors. Design/methodology/approach – The authors applied high voltages in the form of pulses and impulses of various pulse durations and with different amplitudes to polymer thick-film resistors and observed the variation of resistance of these resistors with high voltages. Findings – The paper finds that high voltages can be used for trimming of polymer thick-film resistors in both directions, i.e. upwards and downwards. Research limitations/implications – The research implication of this paper is that polymer thick-film resistors can be trimmed downwards or upwards practically using this method. Practical implications – The practical implications of this paper is that one can trim the polymer thick-film resistors, namely, PVC–graphite thick-film resistors, in both directions, i.e. upwards and downwards, by using this method. Originality/value – The value of the paper is in showing that high voltages can be used to trim downwards and also upwards in the case of polymer thick-film resistors. This type of trimming is called universal trimming, developed first time for polymer thick-film resistors. [ABSTRACT FROM AUTHOR] |
|
Copyright of Microelectronics International is the property of Emerald Publishing Limited and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |