APA (7th ed.) Citation

Besnard, G., Garros, X., Andrieu, F., Nguyen, P., Van Den Daele, W., Reynaud, P., . . . Cristoloveanu, S. (2015). Superior performance and Hot Carrier reliability of strained FDSOI nMOSFETs for advanced CMOS technology nodes. Solid-State Electronics, 113, 127. https://doi.org/10.1016/j.sse.2015.05.021

Chicago Style (17th ed.) Citation

Besnard, G., et al. "Superior Performance and Hot Carrier Reliability of Strained FDSOI NMOSFETs for Advanced CMOS Technology Nodes." Solid-State Electronics 113 (2015): 127. https://doi.org/10.1016/j.sse.2015.05.021.

MLA (9th ed.) Citation

Besnard, G., et al. "Superior Performance and Hot Carrier Reliability of Strained FDSOI NMOSFETs for Advanced CMOS Technology Nodes." Solid-State Electronics, vol. 113, 2015, p. 127, https://doi.org/10.1016/j.sse.2015.05.021.