Investigation of the utility of cellulose acetate butyrate in minimal residue graphene transfer, lithography, and plasma treatments.
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| Title: | Investigation of the utility of cellulose acetate butyrate in minimal residue graphene transfer, lithography, and plasma treatments. |
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| Authors: | Burwell, Gregory1 G.Burwell@swansea.ac.uk, Smith, Nathan2, Guy, Owen1 |
| Source: | Microelectronic Engineering. Oct2015, Vol. 146, p81-84. 4p. |
| Subjects: | Cellulose acetate, Butyrates, Graphene, Fourier transform infrared spectroscopy, Substrates (Materials science) |
| Abstract: | Residues on graphene substrates from polymer-supported transfer and lithography can significantly degrade device performance. Using Fourier transform infrared (FTIR), Raman spectroscopy and Auger electron spectroscopy (AES), cellulose acetate butyrate (CAB) dissolved in ethyl acetate is shown to leave minimal polymer residue on graphene after substrate transfer. The polymer can also be used as a protective under-layer between an electron beam resist and the graphene during electron beam lithography, as well as a protective over-layer during inductively coupled plasma (ICP) etching to slow the etch rate of graphene and remove protruding polymer residues without etching the underlying graphene. CAB is therefore shown to be a useful material for the handling and processing of graphene. [ABSTRACT FROM AUTHOR] |
| Copyright of Microelectronic Engineering is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 109087517 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Investigation of the utility of cellulose acetate butyrate in minimal residue graphene transfer, lithography, and plasma treatments. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Burwell%2C+Gregory%22">Burwell, Gregory</searchLink><relatesTo>1</relatesTo><i> G.Burwell@swansea.ac.uk</i><br /><searchLink fieldCode="AR" term="%22Smith%2C+Nathan%22">Smith, Nathan</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Guy%2C+Owen%22">Guy, Owen</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Microelectronic+Engineering%22">Microelectronic Engineering</searchLink>. Oct2015, Vol. 146, p81-84. 4p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Cellulose+acetate%22">Cellulose acetate</searchLink><br /><searchLink fieldCode="DE" term="%22Butyrates%22">Butyrates</searchLink><br /><searchLink fieldCode="DE" term="%22Graphene%22">Graphene</searchLink><br /><searchLink fieldCode="DE" term="%22Fourier+transform+infrared+spectroscopy%22">Fourier transform infrared spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Substrates+%28Materials+science%29%22">Substrates (Materials science)</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Residues on graphene substrates from polymer-supported transfer and lithography can significantly degrade device performance. Using Fourier transform infrared (FTIR), Raman spectroscopy and Auger electron spectroscopy (AES), cellulose acetate butyrate (CAB) dissolved in ethyl acetate is shown to leave minimal polymer residue on graphene after substrate transfer. The polymer can also be used as a protective under-layer between an electron beam resist and the graphene during electron beam lithography, as well as a protective over-layer during inductively coupled plasma (ICP) etching to slow the etch rate of graphene and remove protruding polymer residues without etching the underlying graphene. CAB is therefore shown to be a useful material for the handling and processing of graphene. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Microelectronic Engineering is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.mee.2015.04.097 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 81 Subjects: – SubjectFull: Cellulose acetate Type: general – SubjectFull: Butyrates Type: general – SubjectFull: Graphene Type: general – SubjectFull: Fourier transform infrared spectroscopy Type: general – SubjectFull: Substrates (Materials science) Type: general Titles: – TitleFull: Investigation of the utility of cellulose acetate butyrate in minimal residue graphene transfer, lithography, and plasma treatments. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Burwell, Gregory – PersonEntity: Name: NameFull: Smith, Nathan – PersonEntity: Name: NameFull: Guy, Owen IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Text: Oct2015 Type: published Y: 2015 Identifiers: – Type: issn-print Value: 01679317 Numbering: – Type: volume Value: 146 Titles: – TitleFull: Microelectronic Engineering Type: main |
| ResultId | 1 |