View in EDS PDF Full Text

Addressing Time-to-Market with Turnkey Measurement and Modeling Systems.

Saved in:
Bibliographic Details
Title: Addressing Time-to-Market with Turnkey Measurement and Modeling Systems. (cover story)
Authors: Dudkiewicz, Steve1
Source: Microwave Journal. Mar2016, Vol. 59 Issue 3, p30-36. 4p.
Subjects: Turnkey computer systems, Technological innovations, Vector analysis, Metal oxide semiconductors, Computer simulation
Abstract: The article focuses on the development of the turnkey measurement and modeling system. Topics mentioned include the linear compact models, the vector analysis, and the importance of technological innovations. Also mentioned are the metal oxide semiconductor (MOS) technology and the advanced measurement and modeling software (IVCAD) measurement.
Database: Engineering Source
Description
Abstract:The article focuses on the development of the turnkey measurement and modeling system. Topics mentioned include the linear compact models, the vector analysis, and the importance of technological innovations. Also mentioned are the metal oxide semiconductor (MOS) technology and the advanced measurement and modeling software (IVCAD) measurement.
ISSN:01926225