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A Low-Power High-Stability Flexible Scan Driver Integrated by IZO TFTs.

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Title: A Low-Power High-Stability Flexible Scan Driver Integrated by IZO TFTs.
Authors: Zhang, Li-Rong1, Huang, Chang-Yu2, Li, Guan-Ming3, Zhou, Lei1, Wu, Wei-Jing3, Xu, Miao3, Wang, Lei3, Ning, Hong-Long3, Yao, Ruo-He2, Peng, Jun-Biao3
Source: IEEE Transactions on Electron Devices. Apr2016, Vol. 63 Issue 4, p1779-1782. 4p.
Subjects: Thin film transistors, Polyimide films, Substrates (Materials science), Electric power consumption, Electric inverters
Abstract: This brief presents a low-power high-stability scan driver integrated by In–Zn–O (IZO) TFTs on polyimide substrate. Observed from the experimental results of the scan driver with 48 stages, there is no distortion and good noise-suppressed characteristics for the output waveforms. In one stage of the proposed scan driver, there only needs a small TFT connected to clock signals by using a feedback inverter and a dc output module to minimize the dynamic power consumption. It is measured that the power consumption for one stage of the proposed gate driver is 18.3 \mu \textW at the output swing of 15.3 V and the clock frequency of 50 kHz. There is a good noise-suppressed characteristic and high stability for the proposed scan driver as shown from a 300-h test. [ABSTRACT FROM AUTHOR]
Copyright of IEEE Transactions on Electron Devices is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
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  Data: A Low-Power High-Stability Flexible Scan Driver Integrated by IZO TFTs.
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  Data: <searchLink fieldCode="AR" term="%22Zhang%2C+Li-Rong%22">Zhang, Li-Rong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Huang%2C+Chang-Yu%22">Huang, Chang-Yu</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Li%2C+Guan-Ming%22">Li, Guan-Ming</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Zhou%2C+Lei%22">Zhou, Lei</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Wu%2C+Wei-Jing%22">Wu, Wei-Jing</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Xu%2C+Miao%22">Xu, Miao</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Wang%2C+Lei%22">Wang, Lei</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Ning%2C+Hong-Long%22">Ning, Hong-Long</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Yao%2C+Ruo-He%22">Yao, Ruo-He</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Peng%2C+Jun-Biao%22">Peng, Jun-Biao</searchLink><relatesTo>3</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electron+Devices%22">IEEE Transactions on Electron Devices</searchLink>. Apr2016, Vol. 63 Issue 4, p1779-1782. 4p.
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  Data: <searchLink fieldCode="DE" term="%22Thin+film+transistors%22">Thin film transistors</searchLink><br /><searchLink fieldCode="DE" term="%22Polyimide+films%22">Polyimide films</searchLink><br /><searchLink fieldCode="DE" term="%22Substrates+%28Materials+science%29%22">Substrates (Materials science)</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+power+consumption%22">Electric power consumption</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+inverters%22">Electric inverters</searchLink>
– Name: Abstract
  Label: Abstract
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  Data: This brief presents a low-power high-stability scan driver integrated by In–Zn–O (IZO) TFTs on polyimide substrate. Observed from the experimental results of the scan driver with 48 stages, there is no distortion and good noise-suppressed characteristics for the output waveforms. In one stage of the proposed scan driver, there only needs a small TFT connected to clock signals by using a feedback inverter and a dc output module to minimize the dynamic power consumption. It is measured that the power consumption for one stage of the proposed gate driver is 18.3 \mu \textW at the output swing of 15.3 V and the clock frequency of 50 kHz. There is a good noise-suppressed characteristic and high stability for the proposed scan driver as shown from a 300-h test. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
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  Data: <i>Copyright of IEEE Transactions on Electron Devices is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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              Text: Apr2016
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