Detection and measurement of delay in the yield of negative ions from the ionization chamber of a mass spectrometer.
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| Title: | Detection and measurement of delay in the yield of negative ions from the ionization chamber of a mass spectrometer. |
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| Authors: | Lukin, V.1 lukin@anrb.ru, Khvostenko, O.1, Tuimedov, G.1 |
| Source: | Technical Physics Letters. Feb2016, Vol. 42 Issue 2, p215-218. 4p. |
| Subjects: | Anion analysis, Ionization chambers, Mass spectrometers, Extraction (Chemistry), Excess electrons |
| Abstract: | The times of extraction of negative ions from the ionization chamber of a mass spectrometer have been measured. The obtained values amount to several dozen microseconds or above-that is, significantly exceed the time of free ion escape from the chamber. It is established that ions are retained in the ionization chamber because of their adsorption on the inner surface. This leads to distortion of the experimentally measured lifetimes of negative ions that become unstable with respect to autodetachment of the excess electron. [ABSTRACT FROM AUTHOR] |
| Copyright of Technical Physics Letters is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 114245662 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Detection and measurement of delay in the yield of negative ions from the ionization chamber of a mass spectrometer. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Lukin%2C+V%2E%22">Lukin, V.</searchLink><relatesTo>1</relatesTo><i> lukin@anrb.ru</i><br /><searchLink fieldCode="AR" term="%22Khvostenko%2C+O%2E%22">Khvostenko, O.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Tuimedov%2C+G%2E%22">Tuimedov, G.</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Technical+Physics+Letters%22">Technical Physics Letters</searchLink>. Feb2016, Vol. 42 Issue 2, p215-218. 4p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Anion+analysis%22">Anion analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Ionization+chambers%22">Ionization chambers</searchLink><br /><searchLink fieldCode="DE" term="%22Mass+spectrometers%22">Mass spectrometers</searchLink><br /><searchLink fieldCode="DE" term="%22Extraction+%28Chemistry%29%22">Extraction (Chemistry)</searchLink><br /><searchLink fieldCode="DE" term="%22Excess+electrons%22">Excess electrons</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The times of extraction of negative ions from the ionization chamber of a mass spectrometer have been measured. The obtained values amount to several dozen microseconds or above-that is, significantly exceed the time of free ion escape from the chamber. It is established that ions are retained in the ionization chamber because of their adsorption on the inner surface. This leads to distortion of the experimentally measured lifetimes of negative ions that become unstable with respect to autodetachment of the excess electron. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Technical Physics Letters is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=114245662 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1134/S1063785016020292 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 215 Subjects: – SubjectFull: Anion analysis Type: general – SubjectFull: Ionization chambers Type: general – SubjectFull: Mass spectrometers Type: general – SubjectFull: Extraction (Chemistry) Type: general – SubjectFull: Excess electrons Type: general Titles: – TitleFull: Detection and measurement of delay in the yield of negative ions from the ionization chamber of a mass spectrometer. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Lukin, V. – PersonEntity: Name: NameFull: Khvostenko, O. – PersonEntity: Name: NameFull: Tuimedov, G. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 02 Text: Feb2016 Type: published Y: 2016 Identifiers: – Type: issn-print Value: 10637850 Numbering: – Type: volume Value: 42 – Type: issue Value: 2 Titles: – TitleFull: Technical Physics Letters Type: main |
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