Benefits of multitone EMC immunity testing.
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| Title: | Benefits of multitone EMC immunity testing. |
|---|---|
| Authors: | Barth, George1 gbarth@arworld.us |
| Source: | International Journal of RF & Microwave Computer-Aided Engineering. May2016, Vol. 26 Issue 4, p355-358. 4p. 4 Graphs. |
| Subjects: | Electromagnetic compatibility, Immunity testing (Electronics), Concurrent engineering, Computer simulation, Performance evaluation |
| Abstract: | ABSTRACT This article proposes a new method of performing Electromagnetic Compatibility (EMC) Immunity Testing using multiple concurrent tones (Multitone) and describes the benefits of such testing including: reduced test time, better utilization of equipment, compatibility with standards, and better simulation of real world threats. © 2016 Wiley Periodicals, Inc. Int J RF and Microwave CAE 26:355-358, 2016. [ABSTRACT FROM AUTHOR] |
| Copyright of International Journal of RF & Microwave Computer-Aided Engineering is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 114605847 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Benefits of multitone EMC immunity testing. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Barth%2C+George%22">Barth, George</searchLink><relatesTo>1</relatesTo><i> gbarth@arworld.us</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22International+Journal+of+RF+%26+Microwave+Computer-Aided+Engineering%22">International Journal of RF & Microwave Computer-Aided Engineering</searchLink>. May2016, Vol. 26 Issue 4, p355-358. 4p. 4 Graphs. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Electromagnetic+compatibility%22">Electromagnetic compatibility</searchLink><br /><searchLink fieldCode="DE" term="%22Immunity+testing+%28Electronics%29%22">Immunity testing (Electronics)</searchLink><br /><searchLink fieldCode="DE" term="%22Concurrent+engineering%22">Concurrent engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+simulation%22">Computer simulation</searchLink><br /><searchLink fieldCode="DE" term="%22Performance+evaluation%22">Performance evaluation</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: ABSTRACT This article proposes a new method of performing Electromagnetic Compatibility (EMC) Immunity Testing using multiple concurrent tones (Multitone) and describes the benefits of such testing including: reduced test time, better utilization of equipment, compatibility with standards, and better simulation of real world threats. © 2016 Wiley Periodicals, Inc. Int J RF and Microwave CAE 26:355-358, 2016. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of International Journal of RF & Microwave Computer-Aided Engineering is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=114605847 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/mmce.20986 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 355 Subjects: – SubjectFull: Electromagnetic compatibility Type: general – SubjectFull: Immunity testing (Electronics) Type: general – SubjectFull: Concurrent engineering Type: general – SubjectFull: Computer simulation Type: general – SubjectFull: Performance evaluation Type: general Titles: – TitleFull: Benefits of multitone EMC immunity testing. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Barth, George IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2016 Type: published Y: 2016 Identifiers: – Type: issn-print Value: 10964290 Numbering: – Type: volume Value: 26 – Type: issue Value: 4 Titles: – TitleFull: International Journal of RF & Microwave Computer-Aided Engineering Type: main |
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