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Application of a Miniature Parallel Strip Line to Hard Disk Drive Immunity Test.

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Title: Application of a Miniature Parallel Strip Line to Hard Disk Drive Immunity Test.
Authors: Paoletti, Umberto1, Noma, Tatsuji1, Nishiyama, Nobumasa2
Source: IEEE Transactions on Electromagnetic Compatibility. Jun2016, Vol. 58 Issue 3, p915-918. 4p.
Subjects: Hard disks, Immunity testing (Electronics), Electromagnetic noise, Electric resistors, Standing wave ratio meters
Abstract: A parallel strip line of very small size has been designed and fabricated in order to study the susceptibility of hard disk drive heads to electromagnetic noise. The target voltage standing wave ratio and internal-to-external field ratio have been confirmed up to at least 6 GHz. Calibration was conducted by measuring the field across the termination resistors. One example of susceptibility test to hard disk drive is shown. [ABSTRACT FROM AUTHOR]
Copyright of IEEE Transactions on Electromagnetic Compatibility is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 114928529
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Application of a Miniature Parallel Strip Line to Hard Disk Drive Immunity Test.
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  Data: <searchLink fieldCode="AR" term="%22Paoletti%2C+Umberto%22">Paoletti, Umberto</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Noma%2C+Tatsuji%22">Noma, Tatsuji</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Nishiyama%2C+Nobumasa%22">Nishiyama, Nobumasa</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electromagnetic+Compatibility%22">IEEE Transactions on Electromagnetic Compatibility</searchLink>. Jun2016, Vol. 58 Issue 3, p915-918. 4p.
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  Data: <searchLink fieldCode="DE" term="%22Hard+disks%22">Hard disks</searchLink><br /><searchLink fieldCode="DE" term="%22Immunity+testing+%28Electronics%29%22">Immunity testing (Electronics)</searchLink><br /><searchLink fieldCode="DE" term="%22Electromagnetic+noise%22">Electromagnetic noise</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+resistors%22">Electric resistors</searchLink><br /><searchLink fieldCode="DE" term="%22Standing+wave+ratio+meters%22">Standing wave ratio meters</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: A parallel strip line of very small size has been designed and fabricated in order to study the susceptibility of hard disk drive heads to electromagnetic noise. The target voltage standing wave ratio and internal-to-external field ratio have been confirmed up to at least 6 GHz. Calibration was conducted by measuring the field across the termination resistors. One example of susceptibility test to hard disk drive is shown. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of IEEE Transactions on Electromagnetic Compatibility is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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        Value: 10.1109/TEMC.2016.2524551
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      – Code: eng
        Text: English
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        Type: general
      – SubjectFull: Immunity testing (Electronics)
        Type: general
      – SubjectFull: Electromagnetic noise
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      – SubjectFull: Electric resistors
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      – SubjectFull: Standing wave ratio meters
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      – TitleFull: Application of a Miniature Parallel Strip Line to Hard Disk Drive Immunity Test.
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              Text: Jun2016
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