Bibliographic Details
| Title: |
A new particle-induced X-ray emission set-up for laterally resolved analysis over wide areas. |
| Authors: |
Hanf, D.1 d.hanf@hzdr.de, Buchriegler, J.1, Renno, A.D.2, Merchel, S.2, Munnik, F.1, Ziegenrücker, R.2, Scharf, O.3, Nowak, S.H.3, von Borany, J.1 |
| Source: |
Nuclear Instruments & Methods in Physics Research Section B. Jun2016, Vol. 377, p17-24. 8p. |
| Subjects: |
Particle induced X-ray emission, Geometallurgy, X-ray optics, X-ray photogrammetry, Tin ores, Photons |
| Abstract: |
The recently installed and unique PIXE (particle-induced X-ray emission) set-up at the Helmholtz-Zentrum Dresden-Rossendorf (HZDR) is mainly dedicated to applications for a detailed overview of elemental composition over large sample areas within a short time even at trace level. The so-called High-Speed-PIXE (HS-PIXE), a combination of a pnCCD-based pixel-detector with polycapillary X-ray optics, offers simultaneous imaging of sample areas up to 12 × 12 mm 2 with a lateral resolution better than 100 μm. Each of the 264 × 264 individual pixels detects X-ray photons in an energy range from 2 keV to 20 keV with an energy resolution of 152 eV (@Mn-K α ). A high precision sample manipulator offers the inspection of areas up to 250 × 250 mm 2 . During first experiments the determined resolution is (76 ± 23) μm using a sample of well-known sharp-edged chromium patterns. Trace element analysis has been performed using a geological sample, a tin ore, with an average Ta-concentration below 0.1 at.%. Fine-zoned structures became visible in the Ta-L α intensity map within only 45 min. The High-Speed-PIXE closes a gap in the analytical process flow chain especially for geoanalytical characterisations. It is a unique and fast detection system to identify areas of interest in comparably short time at large-area scale for further analysis. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
