View in EDS

A new particle-induced X-ray emission set-up for laterally resolved analysis over wide areas.

Saved in:
Bibliographic Details
Title: A new particle-induced X-ray emission set-up for laterally resolved analysis over wide areas.
Authors: Hanf, D.1 d.hanf@hzdr.de, Buchriegler, J.1, Renno, A.D.2, Merchel, S.2, Munnik, F.1, Ziegenrücker, R.2, Scharf, O.3, Nowak, S.H.3, von Borany, J.1
Source: Nuclear Instruments & Methods in Physics Research Section B. Jun2016, Vol. 377, p17-24. 8p.
Subjects: Particle induced X-ray emission, Geometallurgy, X-ray optics, X-ray photogrammetry, Tin ores, Photons
Abstract: The recently installed and unique PIXE (particle-induced X-ray emission) set-up at the Helmholtz-Zentrum Dresden-Rossendorf (HZDR) is mainly dedicated to applications for a detailed overview of elemental composition over large sample areas within a short time even at trace level. The so-called High-Speed-PIXE (HS-PIXE), a combination of a pnCCD-based pixel-detector with polycapillary X-ray optics, offers simultaneous imaging of sample areas up to 12 × 12 mm 2 with a lateral resolution better than 100 μm. Each of the 264 × 264 individual pixels detects X-ray photons in an energy range from 2 keV to 20 keV with an energy resolution of 152 eV (@Mn-K α ). A high precision sample manipulator offers the inspection of areas up to 250 × 250 mm 2 . During first experiments the determined resolution is (76 ± 23) μm using a sample of well-known sharp-edged chromium patterns. Trace element analysis has been performed using a geological sample, a tin ore, with an average Ta-concentration below 0.1 at.%. Fine-zoned structures became visible in the Ta-L α intensity map within only 45 min. The High-Speed-PIXE closes a gap in the analytical process flow chain especially for geoanalytical characterisations. It is a unique and fast detection system to identify areas of interest in comparably short time at large-area scale for further analysis. [ABSTRACT FROM AUTHOR]
Copyright of Nuclear Instruments & Methods in Physics Research Section B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 115213768
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: A new particle-induced X-ray emission set-up for laterally resolved analysis over wide areas.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Hanf%2C+D%2E%22">Hanf, D.</searchLink><relatesTo>1</relatesTo><i> d.hanf@hzdr.de</i><br /><searchLink fieldCode="AR" term="%22Buchriegler%2C+J%2E%22">Buchriegler, J.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Renno%2C+A%2ED%2E%22">Renno, A.D.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Merchel%2C+S%2E%22">Merchel, S.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Munnik%2C+F%2E%22">Munnik, F.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Ziegenrücker%2C+R%2E%22">Ziegenrücker, R.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Scharf%2C+O%2E%22">Scharf, O.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Nowak%2C+S%2EH%2E%22">Nowak, S.H.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22von+Borany%2C+J%2E%22">von Borany, J.</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Nuclear+Instruments+%26+Methods+in+Physics+Research+Section+B%22">Nuclear Instruments & Methods in Physics Research Section B</searchLink>. Jun2016, Vol. 377, p17-24. 8p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Particle+induced+X-ray+emission%22">Particle induced X-ray emission</searchLink><br /><searchLink fieldCode="DE" term="%22Geometallurgy%22">Geometallurgy</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+optics%22">X-ray optics</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+photogrammetry%22">X-ray photogrammetry</searchLink><br /><searchLink fieldCode="DE" term="%22Tin+ores%22">Tin ores</searchLink><br /><searchLink fieldCode="DE" term="%22Photons%22">Photons</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The recently installed and unique PIXE (particle-induced X-ray emission) set-up at the Helmholtz-Zentrum Dresden-Rossendorf (HZDR) is mainly dedicated to applications for a detailed overview of elemental composition over large sample areas within a short time even at trace level. The so-called High-Speed-PIXE (HS-PIXE), a combination of a pnCCD-based pixel-detector with polycapillary X-ray optics, offers simultaneous imaging of sample areas up to 12 × 12 mm 2 with a lateral resolution better than 100 μm. Each of the 264 × 264 individual pixels detects X-ray photons in an energy range from 2 keV to 20 keV with an energy resolution of 152 eV (@Mn-K α ). A high precision sample manipulator offers the inspection of areas up to 250 × 250 mm 2 . During first experiments the determined resolution is (76 ± 23) μm using a sample of well-known sharp-edged chromium patterns. Trace element analysis has been performed using a geological sample, a tin ore, with an average Ta-concentration below 0.1 at.%. Fine-zoned structures became visible in the Ta-L α intensity map within only 45 min. The High-Speed-PIXE closes a gap in the analytical process flow chain especially for geoanalytical characterisations. It is a unique and fast detection system to identify areas of interest in comparably short time at large-area scale for further analysis. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Nuclear Instruments & Methods in Physics Research Section B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=115213768
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.nimb.2016.03.032
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 17
    Subjects:
      – SubjectFull: Particle induced X-ray emission
        Type: general
      – SubjectFull: Geometallurgy
        Type: general
      – SubjectFull: X-ray optics
        Type: general
      – SubjectFull: X-ray photogrammetry
        Type: general
      – SubjectFull: Tin ores
        Type: general
      – SubjectFull: Photons
        Type: general
    Titles:
      – TitleFull: A new particle-induced X-ray emission set-up for laterally resolved analysis over wide areas.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Hanf, D.
      – PersonEntity:
          Name:
            NameFull: Buchriegler, J.
      – PersonEntity:
          Name:
            NameFull: Renno, A.D.
      – PersonEntity:
          Name:
            NameFull: Merchel, S.
      – PersonEntity:
          Name:
            NameFull: Munnik, F.
      – PersonEntity:
          Name:
            NameFull: Ziegenrücker, R.
      – PersonEntity:
          Name:
            NameFull: Scharf, O.
      – PersonEntity:
          Name:
            NameFull: Nowak, S.H.
      – PersonEntity:
          Name:
            NameFull: von Borany, J.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 15
              M: 06
              Text: Jun2016
              Type: published
              Y: 2016
          Identifiers:
            – Type: issn-print
              Value: 0168583X
          Numbering:
            – Type: volume
              Value: 377
          Titles:
            – TitleFull: Nuclear Instruments & Methods in Physics Research Section B
              Type: main
ResultId 1