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EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns.

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Title: EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns.
Authors: Liu, Hongwei1, Foley, Matthew1, Lin, Qingyun2, Liu, Jiangwen3
Source: Journal of Applied Crystallography. Apr2016, Vol. 49 Issue 2, p636-641. 5p.
Subjects: X-ray diffraction, Laue experiment, Bulk solids, Electron diffraction, Wave diffraction
Abstract: Mny commercial software packages for X-ray diffraction pattern analysis are capable of identifying multiple phases in bulk materials. However, X-ray diffraction patterns cannot record those phases with very small volume ratio or non-homogeneous distribution, which may mean that researchers have to use instead electron diffraction patterns from a very small region of interest. EDP2XRD, a new program for converting electron diffraction patterns into X-ray diffraction patterns, is described here. The program has been developed in order to utilize X-ray analysis software for electron diffraction patterns taken from mixed-phase nanocrystalline materials with a transmission electron microscope. It is specifically designed for material researchers who are engaged in crystallographic microstructure analysis. The difference from other popular commercial software for crystallography is that this program provides new options to convert and plot X-ray diffraction patterns for arbitrary electron diffraction rings and to process raw images to enhance conversion performance. The program contains the necessary crystallographic calculator to list planar d spacings and corresponding X-ray diffraction angles. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
Description
Abstract:Mny commercial software packages for X-ray diffraction pattern analysis are capable of identifying multiple phases in bulk materials. However, X-ray diffraction patterns cannot record those phases with very small volume ratio or non-homogeneous distribution, which may mean that researchers have to use instead electron diffraction patterns from a very small region of interest. EDP2XRD, a new program for converting electron diffraction patterns into X-ray diffraction patterns, is described here. The program has been developed in order to utilize X-ray analysis software for electron diffraction patterns taken from mixed-phase nanocrystalline materials with a transmission electron microscope. It is specifically designed for material researchers who are engaged in crystallographic microstructure analysis. The difference from other popular commercial software for crystallography is that this program provides new options to convert and plot X-ray diffraction patterns for arbitrary electron diffraction rings and to process raw images to enhance conversion performance. The program contains the necessary crystallographic calculator to list planar d spacings and corresponding X-ray diffraction angles. [ABSTRACT FROM AUTHOR]
ISSN:00218898
DOI:10.1107/S1600576716000613