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EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns.

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Title: EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns.
Authors: Liu, Hongwei1, Foley, Matthew1, Lin, Qingyun2, Liu, Jiangwen3
Source: Journal of Applied Crystallography. Apr2016, Vol. 49 Issue 2, p636-641. 5p.
Subjects: X-ray diffraction, Laue experiment, Bulk solids, Electron diffraction, Wave diffraction
Abstract: Mny commercial software packages for X-ray diffraction pattern analysis are capable of identifying multiple phases in bulk materials. However, X-ray diffraction patterns cannot record those phases with very small volume ratio or non-homogeneous distribution, which may mean that researchers have to use instead electron diffraction patterns from a very small region of interest. EDP2XRD, a new program for converting electron diffraction patterns into X-ray diffraction patterns, is described here. The program has been developed in order to utilize X-ray analysis software for electron diffraction patterns taken from mixed-phase nanocrystalline materials with a transmission electron microscope. It is specifically designed for material researchers who are engaged in crystallographic microstructure analysis. The difference from other popular commercial software for crystallography is that this program provides new options to convert and plot X-ray diffraction patterns for arbitrary electron diffraction rings and to process raw images to enhance conversion performance. The program contains the necessary crystallographic calculator to list planar d spacings and corresponding X-ray diffraction angles. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 115376322
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns.
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  Data: <searchLink fieldCode="AR" term="%22Liu%2C+Hongwei%22">Liu, Hongwei</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Foley%2C+Matthew%22">Foley, Matthew</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Lin%2C+Qingyun%22">Lin, Qingyun</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Liu%2C+Jiangwen%22">Liu, Jiangwen</searchLink><relatesTo>3</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Crystallography%22">Journal of Applied Crystallography</searchLink>. Apr2016, Vol. 49 Issue 2, p636-641. 5p.
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  Data: <searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Laue+experiment%22">Laue experiment</searchLink><br /><searchLink fieldCode="DE" term="%22Bulk+solids%22">Bulk solids</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+diffraction%22">Electron diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Wave+diffraction%22">Wave diffraction</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Mny commercial software packages for X-ray diffraction pattern analysis are capable of identifying multiple phases in bulk materials. However, X-ray diffraction patterns cannot record those phases with very small volume ratio or non-homogeneous distribution, which may mean that researchers have to use instead electron diffraction patterns from a very small region of interest. EDP2XRD, a new program for converting electron diffraction patterns into X-ray diffraction patterns, is described here. The program has been developed in order to utilize X-ray analysis software for electron diffraction patterns taken from mixed-phase nanocrystalline materials with a transmission electron microscope. It is specifically designed for material researchers who are engaged in crystallographic microstructure analysis. The difference from other popular commercial software for crystallography is that this program provides new options to convert and plot X-ray diffraction patterns for arbitrary electron diffraction rings and to process raw images to enhance conversion performance. The program contains the necessary crystallographic calculator to list planar d spacings and corresponding X-ray diffraction angles. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1107/S1600576716000613
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 636
    Subjects:
      – SubjectFull: X-ray diffraction
        Type: general
      – SubjectFull: Laue experiment
        Type: general
      – SubjectFull: Bulk solids
        Type: general
      – SubjectFull: Electron diffraction
        Type: general
      – SubjectFull: Wave diffraction
        Type: general
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      – TitleFull: EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns.
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            NameFull: Liu, Hongwei
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            NameFull: Foley, Matthew
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            NameFull: Lin, Qingyun
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            NameFull: Liu, Jiangwen
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            – D: 01
              M: 04
              Text: Apr2016
              Type: published
              Y: 2016
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            – TitleFull: Journal of Applied Crystallography
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