Development of an optical inspection platform for surface defect detection in touch panel glass.
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| Title: | Development of an optical inspection platform for surface defect detection in touch panel glass. |
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| Authors: | Chang, Ming1,2 (AUTHOR) ming@cycu.edu.tw, Chen, Bo-Cheng2 (AUTHOR), Gabayno, Jacque Lynn3,4 (AUTHOR), Chen, Ming-Fu5 (AUTHOR) |
| Source: | International Journal of Optomechatronics. 2016, Vol. 10 Issue 2, p63-72. 10p. |
| Subjects: | Optical quality control, Surface defects, Touch screens, High resolution imaging, Image analysis, Image processing |
| Abstract: | An optical inspection platform combining parallel image processing with high resolution opto-mechanical module was developed for defect inspection of touch panel glass. Dark field images were acquired using a 12288-pixel line CCD camera with 3.5 µm per pixel resolution and 12 kHz line rate. Key features of the glass surface were analyzed by parallel image processing on combined CPU and GPU platforms. Defect inspection of touch panel glass, which provided 386 megapixel image data per sample, was completed in roughly 5 seconds. High detection rate of surface scratches on the touch panel glass was realized with minimum defects size of about 10 µm after inspection. The implementation of a custom illumination source significantly improved the scattering efficiency on the surface, therefore enhancing the contrast in the acquired images and overall performance of the inspection system. [ABSTRACT FROM PUBLISHER] |
| Copyright of International Journal of Optomechatronics is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 116170444 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Development of an optical inspection platform for surface defect detection in touch panel glass. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Chang%2C+Ming%22">Chang, Ming</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> ming@cycu.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Chen%2C+Bo-Cheng%22">Chen, Bo-Cheng</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Gabayno%2C+Jacque+Lynn%22">Gabayno, Jacque Lynn</searchLink><relatesTo>3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Ming-Fu%22">Chen, Ming-Fu</searchLink><relatesTo>5</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Optomechatronics%22">International Journal of Optomechatronics</searchLink>. 2016, Vol. 10 Issue 2, p63-72. 10p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Optical+quality+control%22">Optical quality control</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+defects%22">Surface defects</searchLink><br /><searchLink fieldCode="DE" term="%22Touch+screens%22">Touch screens</searchLink><br /><searchLink fieldCode="DE" term="%22High+resolution+imaging%22">High resolution imaging</searchLink><br /><searchLink fieldCode="DE" term="%22Image+analysis%22">Image analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Image+processing%22">Image processing</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: An optical inspection platform combining parallel image processing with high resolution opto-mechanical module was developed for defect inspection of touch panel glass. Dark field images were acquired using a 12288-pixel line CCD camera with 3.5 µm per pixel resolution and 12 kHz line rate. Key features of the glass surface were analyzed by parallel image processing on combined CPU and GPU platforms. Defect inspection of touch panel glass, which provided 386 megapixel image data per sample, was completed in roughly 5 seconds. High detection rate of surface scratches on the touch panel glass was realized with minimum defects size of about 10 µm after inspection. The implementation of a custom illumination source significantly improved the scattering efficiency on the surface, therefore enhancing the contrast in the acquired images and overall performance of the inspection system. [ABSTRACT FROM PUBLISHER] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of International Journal of Optomechatronics is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=116170444 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1080/15599612.2016.1166304 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 63 Subjects: – SubjectFull: Optical quality control Type: general – SubjectFull: Surface defects Type: general – SubjectFull: Touch screens Type: general – SubjectFull: High resolution imaging Type: general – SubjectFull: Image analysis Type: general – SubjectFull: Image processing Type: general Titles: – TitleFull: Development of an optical inspection platform for surface defect detection in touch panel glass. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chang, Ming – PersonEntity: Name: NameFull: Chen, Bo-Cheng – PersonEntity: Name: NameFull: Gabayno, Jacque Lynn – PersonEntity: Name: NameFull: Chen, Ming-Fu IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: 2016 Type: published Y: 2016 Identifiers: – Type: issn-print Value: 15599612 Numbering: – Type: volume Value: 10 – Type: issue Value: 2 Titles: – TitleFull: International Journal of Optomechatronics Type: main |
| ResultId | 1 |