LFSR-Based Generation of Partially-Functional Broadside Tests.
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| Title: | LFSR-Based Generation of Partially-Functional Broadside Tests. |
|---|---|
| Authors: | Pomeranz, Irith1 |
| Source: | IEEE Transactions on Computers. Aug2016, Vol. 65 Issue 8, p2659-2664. 6p. |
| Subjects: | Data compression, Test generators, Hamming distance, Scanning systems, Information theory, Electronic data processing |
| Abstract: | This paper describes a procedure that computes seeds for LFSR-based generation of partially-functional broadside tests. Existing LFSR-based test data compression methods compute seeds based on incompletely-specified test cubes. Functional broadside tests are fully-specified, and they have fully-specified scan-in states. This is the main challenge that the test generation procedure described in this paper needs to address. It addresses it by using a process that modifies an initial seed si in order to reduce the Hamming distance between the scan-in state pi that si creates and a reachable state rj . When the Hamming distance is reduced to zero, the seed can be used for generating functional broadside tests. When the distance is larger than zero, the tests are partially-functional. Experimental results are presented for transition faults in benchmark circuits to demonstrate the resulting distances and fault coverage. [ABSTRACT FROM AUTHOR] |
| Copyright of IEEE Transactions on Computers is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: LFSR-Based Generation of Partially-Functional Broadside Tests. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Pomeranz%2C+Irith%22">Pomeranz, Irith</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Computers%22">IEEE Transactions on Computers</searchLink>. Aug2016, Vol. 65 Issue 8, p2659-2664. 6p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Data+compression%22">Data compression</searchLink><br /><searchLink fieldCode="DE" term="%22Test+generators%22">Test generators</searchLink><br /><searchLink fieldCode="DE" term="%22Hamming+distance%22">Hamming distance</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+systems%22">Scanning systems</searchLink><br /><searchLink fieldCode="DE" term="%22Information+theory%22">Information theory</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+data+processing%22">Electronic data processing</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: This paper describes a procedure that computes seeds for LFSR-based generation of partially-functional broadside tests. Existing LFSR-based test data compression methods compute seeds based on incompletely-specified test cubes. Functional broadside tests are fully-specified, and they have fully-specified scan-in states. This is the main challenge that the test generation procedure described in this paper needs to address. It addresses it by using a process that modifies an initial seed si in order to reduce the Hamming distance between the scan-in state pi that si creates and a reachable state rj . When the Hamming distance is reduced to zero, the seed can be used for generating functional broadside tests. When the distance is larger than zero, the tests are partially-functional. Experimental results are presented for transition faults in benchmark circuits to demonstrate the resulting distances and fault coverage. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of IEEE Transactions on Computers is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TC.2015.2488621 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 2659 Subjects: – SubjectFull: Data compression Type: general – SubjectFull: Test generators Type: general – SubjectFull: Hamming distance Type: general – SubjectFull: Scanning systems Type: general – SubjectFull: Information theory Type: general – SubjectFull: Electronic data processing Type: general Titles: – TitleFull: LFSR-Based Generation of Partially-Functional Broadside Tests. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Pomeranz, Irith IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2016 Type: published Y: 2016 Identifiers: – Type: issn-print Value: 00189340 Numbering: – Type: volume Value: 65 – Type: issue Value: 8 Titles: – TitleFull: IEEE Transactions on Computers Type: main |
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