APA (7th ed.) Citation

Gu, R., Lei, W., Antoszewski, J., & Faraone, L. (2016). Investigation of Substrate Effects on Interface Strain and Defect Generation in MBE-Grown HgCdTe. Journal of Electronic Materials, 45(9), 4596. https://doi.org/10.1007/s11664-016-4558-6

Chicago Style (17th ed.) Citation

Gu, R., W. Lei, J. Antoszewski, and L. Faraone. "Investigation of Substrate Effects on Interface Strain and Defect Generation in MBE-Grown HgCdTe." Journal of Electronic Materials 45, no. 9 (2016): 4596. https://doi.org/10.1007/s11664-016-4558-6.

MLA (9th ed.) Citation

Gu, R., et al. "Investigation of Substrate Effects on Interface Strain and Defect Generation in MBE-Grown HgCdTe." Journal of Electronic Materials, vol. 45, no. 9, 2016, p. 4596, https://doi.org/10.1007/s11664-016-4558-6.