APA (7th ed.) Citation

Ma, A. M., Shen, M., Afshar, A., Tsui, Y. Y., Cadien, K. C., & Barlage, D. W. (2016). Interfacial Contact Effects in Top Gated Zinc Oxide Thin Film Transistors Grown by Atomic Layer Deposition. IEEE Transactions on Electron Devices, 63(9), 3540. https://doi.org/10.1109/TED.2016.2586418

Chicago Style (17th ed.) Citation

Ma, Alex M., Mei Shen, Amir Afshar, Ying Y. Tsui, Kenneth C. Cadien, and Douglas W. Barlage. "Interfacial Contact Effects in Top Gated Zinc Oxide Thin Film Transistors Grown by Atomic Layer Deposition." IEEE Transactions on Electron Devices 63, no. 9 (2016): 3540. https://doi.org/10.1109/TED.2016.2586418.

MLA (9th ed.) Citation

Ma, Alex M., et al. "Interfacial Contact Effects in Top Gated Zinc Oxide Thin Film Transistors Grown by Atomic Layer Deposition." IEEE Transactions on Electron Devices, vol. 63, no. 9, 2016, p. 3540, https://doi.org/10.1109/TED.2016.2586418.