Technique for Contactless Measurements of the Electromagnetic Parameters of Thin Films and Nanomaterials.
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| Title: | Technique for Contactless Measurements of the Electromagnetic Parameters of Thin Films and Nanomaterials. |
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| Authors: | Skvortsov, B.1, Borminskii, S.1, Solntseva, A.1 als063@mail.ru |
| Source: | Measurement Techniques. Sep2016, Vol. 59 Issue 6, p663-670. 8p. |
| Subjects: | Electromagnetism, Thin films, Nanostructured materials, Problem solving, Algebraic equations |
| Abstract: | A contactless operational method for measuring the electromagnetic parameters of thin films and nanomaterials is developed. It is based on probing the monitored surface with an electromagnetic signal. The measurement procedure is described mathematically. A method is presented for calculating the unknown parameters based on measuring the amplitude and phase of the reflected signal at different frequencies and solving a system of algebraic equations. [ABSTRACT FROM AUTHOR] |
| Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 118912238 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Technique for Contactless Measurements of the Electromagnetic Parameters of Thin Films and Nanomaterials. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Skvortsov%2C+B%2E%22">Skvortsov, B.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Borminskii%2C+S%2E%22">Borminskii, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Solntseva%2C+A%2E%22">Solntseva, A.</searchLink><relatesTo>1</relatesTo><i> als063@mail.ru</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Measurement+Techniques%22">Measurement Techniques</searchLink>. Sep2016, Vol. 59 Issue 6, p663-670. 8p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Electromagnetism%22">Electromagnetism</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Nanostructured+materials%22">Nanostructured materials</searchLink><br /><searchLink fieldCode="DE" term="%22Problem+solving%22">Problem solving</searchLink><br /><searchLink fieldCode="DE" term="%22Algebraic+equations%22">Algebraic equations</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: A contactless operational method for measuring the electromagnetic parameters of thin films and nanomaterials is developed. It is based on probing the monitored surface with an electromagnetic signal. The measurement procedure is described mathematically. A method is presented for calculating the unknown parameters based on measuring the amplitude and phase of the reflected signal at different frequencies and solving a system of algebraic equations. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=118912238 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11018-016-1027-9 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 663 Subjects: – SubjectFull: Electromagnetism Type: general – SubjectFull: Thin films Type: general – SubjectFull: Nanostructured materials Type: general – SubjectFull: Problem solving Type: general – SubjectFull: Algebraic equations Type: general Titles: – TitleFull: Technique for Contactless Measurements of the Electromagnetic Parameters of Thin Films and Nanomaterials. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Skvortsov, B. – PersonEntity: Name: NameFull: Borminskii, S. – PersonEntity: Name: NameFull: Solntseva, A. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 09 Text: Sep2016 Type: published Y: 2016 Identifiers: – Type: issn-print Value: 05431972 Numbering: – Type: volume Value: 59 – Type: issue Value: 6 Titles: – TitleFull: Measurement Techniques Type: main |
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