Simulating operator learning during production ramp-up in parallel vs. serial flow production.
Saved in:
| Title: | Simulating operator learning during production ramp-up in parallel vs. serial flow production. |
|---|---|
| Authors: | Neumann, W. Patrick1 (AUTHOR) pneumann@ryerson.ca, Medbo, Per2 (AUTHOR) |
| Source: | International Journal of Production Research. Feb2017, Vol. 55 Issue 3, p845-857. 13p. |
| Subjects: | Ergonomics, Discrete element method, Product usage segmentation, Human factors in management information systems, Production (Economic theory), Product life cycle |
| Abstract: | The aim of this research is to demonstrate how human learning models can be integrated into discrete event simulation to examine ramp-up time differences between serial and parallel flow production strategies. The experimental model examined three levels of learning rate and minimum cycle times. Results show that while the parallel flow system had longer ramp-up times than serial flow systems, they also had higher maximum throughput capacity. As a result, the parallel flow system frequently outperformed lines within the first weeks of operation. There is a critical lack of empirical evidence or methods that would allow designers to accurately determine what the critical learning paramters might be in their specific operations, and further research is needed to create predictive tools in this important area. [ABSTRACT FROM PUBLISHER] |
| Copyright of International Journal of Production Research is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!