Kinetics of Spherical Interface in Crystal Growth.
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| Title: | Kinetics of Spherical Interface in Crystal Growth. |
|---|---|
| Authors: | Mei-Qin Fu1, Qing-Ling Bi1, Yong-Jun Lü1 yongjunlv@bit.edu.cn |
| Source: | Chinese Physics Letters. Mar2017, Vol. 34 Issue 4, p1-1. 1p. |
| Subjects: | Crystal growth, Interfaces (Physical sciences), Chemical kinetics, Nickel alloys, Thickness measurement |
| Abstract: | The growth kinetics of spherical NiAl and CuZr crystals are studied by using molecular dynamics simulations. The growth rates of crystals are found to increase with the grain radius. The simulations show that the interface thickness and the Jackson α-factor increase as the growth proceeds, indicating that the interface becomes increasingly rough during growth. Due to the increasing interface roughening, the fraction of repeatable growth sites at interface f is proposed to actually increase in growth. An attachment rate, which is defined as the fraction of atoms that join the crystal interface without leaving, is used to approximate f, displaying a linear increase. With this approximation, we predict the growth rates as a function of the crystal radius, and the results qualitatively agree with those from the direct simulations. [ABSTRACT FROM AUTHOR] |
| Copyright of Chinese Physics Letters is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 122271575 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Kinetics of Spherical Interface in Crystal Growth. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Mei-Qin+Fu%22">Mei-Qin Fu</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Qing-Ling+Bi%22">Qing-Ling Bi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Yong-Jun+Lü%22">Yong-Jun Lü</searchLink><relatesTo>1</relatesTo><i> yongjunlv@bit.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Chinese+Physics+Letters%22">Chinese Physics Letters</searchLink>. Mar2017, Vol. 34 Issue 4, p1-1. 1p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Crystal+growth%22">Crystal growth</searchLink><br /><searchLink fieldCode="DE" term="%22Interfaces+%28Physical+sciences%29%22">Interfaces (Physical sciences)</searchLink><br /><searchLink fieldCode="DE" term="%22Chemical+kinetics%22">Chemical kinetics</searchLink><br /><searchLink fieldCode="DE" term="%22Nickel+alloys%22">Nickel alloys</searchLink><br /><searchLink fieldCode="DE" term="%22Thickness+measurement%22">Thickness measurement</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The growth kinetics of spherical NiAl and CuZr crystals are studied by using molecular dynamics simulations. The growth rates of crystals are found to increase with the grain radius. The simulations show that the interface thickness and the Jackson α-factor increase as the growth proceeds, indicating that the interface becomes increasingly rough during growth. Due to the increasing interface roughening, the fraction of repeatable growth sites at interface f is proposed to actually increase in growth. An attachment rate, which is defined as the fraction of atoms that join the crystal interface without leaving, is used to approximate f, displaying a linear increase. With this approximation, we predict the growth rates as a function of the crystal radius, and the results qualitatively agree with those from the direct simulations. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Chinese Physics Letters is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1088/0256-307X/34/4/048102 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 1 StartPage: 1 Subjects: – SubjectFull: Crystal growth Type: general – SubjectFull: Interfaces (Physical sciences) Type: general – SubjectFull: Chemical kinetics Type: general – SubjectFull: Nickel alloys Type: general – SubjectFull: Thickness measurement Type: general Titles: – TitleFull: Kinetics of Spherical Interface in Crystal Growth. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Mei-Qin Fu – PersonEntity: Name: NameFull: Qing-Ling Bi – PersonEntity: Name: NameFull: Yong-Jun Lü IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 03 Text: Mar2017 Type: published Y: 2017 Identifiers: – Type: issn-print Value: 0256307X Numbering: – Type: volume Value: 34 – Type: issue Value: 4 Titles: – TitleFull: Chinese Physics Letters Type: main |
| ResultId | 1 |
