Electrical characterization of flame-soot nanoparticle thin films.
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| Title: | Electrical characterization of flame-soot nanoparticle thin films. |
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| Authors: | De Falco, Gianluigi1, Commodo, Mario1 commodo@irc.cnr.it, Barra, Mario2,3 Mario.barra@spin.cnr.it, Chiarella, Fabio2,3, D’Anna, Andrea4, Aloisio, Alberto3,5, Cassinese, Antonio2,3, Minutolo, Patrizia1 |
| Source: | Synthetic Metals. Jul2017, Vol. 229, p89-99. 11p. |
| Subjects: | Soot, Electric properties of thin films, Molecular self-assembly, Thermophoresis, Raman spectroscopy |
| Abstract: | Carbon nanoparticles, with diameter d ∼10 nm, were produced in a premixed ethylene-air flame and used to grow self-assembled thin films by thermophoretic deposition on Si ++ /SiO 2 /Gold multilayer substrates inserted in flame. The particles’ size was measured by a Scanning Mobility Particle Sizer. UV–vis light absorption, Raman spectroscopy and Atomic Force Microscopy were used for the chemico-physical and morphological investigation of the carbon nanoparticle thin films. The electrical characterization was then performed in different environmental conditions with the basic aim to assess the potentiality of these films to be employed as electrically-active components in electronic and sensing applications. The films are composed by the aggregation of nanoscale grains whose size increases with the deposition time and are consequently highly porous with the electrical conduction properties showing a dependence on thickness suggesting a percolation-like behavior. Raman spectrum indicates that the chemical/structural composition of the film does not change with deposition time and consists in small graphitic crystallites with constant size. The electrical measurements show also the ohmic behavior of the IV curves. Moreover, an ambipolar response of the CNPs channels, when investigated in the field-effect configuration, was observed and, in parallel with conductivity, charge carrier mobility values were found to increase with thickness. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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