APA (7th ed.) Citation

Wu, W., Zhang, L., Xu, Z., Zhou, L., Tao, H., Zou, J., . . . Peng, J. (2017). A High-Reliability Gate Driver Integrated in Flexible AMOLED Display by IZO TFTs. IEEE Transactions on Electron Devices, 64(5), 1991. https://doi.org/10.1109/TED.2016.2641448

Chicago Style (17th ed.) Citation

Wu, Wei-Jing, Li-Rong Zhang, Zhi-Ping Xu, Lei Zhou, Hao Tao, Jian-Hua Zou, Miao Xu, Lei Wang, and Jun-Biao Peng. "A High-Reliability Gate Driver Integrated in Flexible AMOLED Display by IZO TFTs." IEEE Transactions on Electron Devices 64, no. 5 (2017): 1991. https://doi.org/10.1109/TED.2016.2641448.

MLA (9th ed.) Citation

Wu, Wei-Jing, et al. "A High-Reliability Gate Driver Integrated in Flexible AMOLED Display by IZO TFTs." IEEE Transactions on Electron Devices, vol. 64, no. 5, 2017, p. 1991, https://doi.org/10.1109/TED.2016.2641448.