A High-Reliability Gate Driver Integrated in Flexible AMOLED Display by IZO TFTs.
Saved in:
| Title: | A High-Reliability Gate Driver Integrated in Flexible AMOLED Display by IZO TFTs. |
|---|---|
| Authors: | Wu, Wei-Jing1, Zhang, Li-Rong2, Xu, Zhi-Ping1, Zhou, Lei2, Tao, Hao2, Zou, Jian-Hua2, Xu, Miao1, Wang, Lei1, Peng, Jun-Biao1 |
| Source: | IEEE Transactions on Electron Devices. May2017, Vol. 64 Issue 5, p1991-1996. 6p. |
| Subjects: | Thin film transistors, Polyimide films, Light emitting diodes, Capacitors, Electric distortion |
| Abstract: | This paper presents a new gate driver integrated by IZO thin-film transistors (TFTs) with the etch stop layer structure on the polyimide substrate, which consists of nine TFTs and two capacitors. There are several advantages for the proposed gate driver, such as simple circuitry, full-swing output, low power, and good reliability. The proposed gate driver has been successfully integrated in a flexible active matrix organic light emitting display with the resolution of 200 (RGB) $\times 600$ , in which the conventional 2T1C pixel circuit with bottom-emission structure is used. It is shown that there are no distortion and good noise-suppressed characteristics for the output signals even up to 600 stages. In addition, the proposed gate driver has a good stability, since no voltage fluctuation occurs under 720-h test. Moreover, the flexible panel works well after a 10000 times repetitive bending performed on a test bench, which is mainly composed of a programmed logic controller and dc motor. During the bending test, the minimum curvature radius of flexible panel can reach to be about 5 mm. [ABSTRACT FROM AUTHOR] |
| Copyright of IEEE Transactions on Electron Devices is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
Be the first to leave a comment!