APA (7th ed.) Citation

Azizi, M., & Mansour, R. R. (2017). Design and Sensitivity Improvement of CMOS-MEMS Scanning Microwave Microscopes. IEEE Transactions on Microwave Theory & Techniques, 65(8), 2749. https://doi.org/10.1109/TMTT.2017.2671359

Chicago Style (17th ed.) Citation

Azizi, Mostafa, and Raafat R. Mansour. "Design and Sensitivity Improvement of CMOS-MEMS Scanning Microwave Microscopes." IEEE Transactions on Microwave Theory & Techniques 65, no. 8 (2017): 2749. https://doi.org/10.1109/TMTT.2017.2671359.

MLA (9th ed.) Citation

Azizi, Mostafa, and Raafat R. Mansour. "Design and Sensitivity Improvement of CMOS-MEMS Scanning Microwave Microscopes." IEEE Transactions on Microwave Theory & Techniques, vol. 65, no. 8, 2017, p. 2749, https://doi.org/10.1109/TMTT.2017.2671359.