Fukuma, M., Maeno, T., & Fukunaga, K. (2004). High Repetition Rate PEA System for In-situ Space Charge Measurement During Breakdown Tests. IEEE Transactions on Dielectrics & Electrical Insulation, 11(1), 155. https://doi.org/10.1109/TDEI.2004.1266330
Chicago Style (17th ed.) CitationFukuma, M., T. Maeno, and K. Fukunaga. "High Repetition Rate PEA System for In-situ Space Charge Measurement During Breakdown Tests." IEEE Transactions on Dielectrics & Electrical Insulation 11, no. 1 (2004): 155. https://doi.org/10.1109/TDEI.2004.1266330.
MLA (9th ed.) CitationFukuma, M., et al. "High Repetition Rate PEA System for In-situ Space Charge Measurement During Breakdown Tests." IEEE Transactions on Dielectrics & Electrical Insulation, vol. 11, no. 1, 2004, p. 155, https://doi.org/10.1109/TDEI.2004.1266330.