A Novel Segmentation Approach for Modeling of Radiated Emission and Immunity Test Setups.

Saved in:
Bibliographic Details
Title: A Novel Segmentation Approach for Modeling of Radiated Emission and Immunity Test Setups.
Authors: Reddy, V. S.1, Kralicek, Peter2, Hansen, Jan3
Source: IEEE Transactions on Electromagnetic Compatibility. Dec2017, Vol. 59 Issue 6, p1781-1790. 10p.
Subjects: Immunity testing (Electronics), Electronic control, Electromagnetic testing, Huygens' principle, Wave theory of light
Abstract: A novel procedure is developed to simulate radiated emission (RE) and immunity scenarios using a common approach for electronic control unit with complex wiring harness and terminations. This is possible by applying Huygens principle and Reciprocity theorem to the problem. A segmented approach is proposed to split the device under test into multiple segments, which converts the radiation problem to circuit simulation, in addition to reducing the requirement of computing resources. The proposed method is validated using measurements and also full-wave three-dimensional simulations for both RE and immunity test setups. [ABSTRACT FROM PUBLISHER]
Copyright of IEEE Transactions on Electromagnetic Compatibility is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 124764974
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: A Novel Segmentation Approach for Modeling of Radiated Emission and Immunity Test Setups.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Reddy%2C+V%2E+S%2E%22">Reddy, V. S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Kralicek%2C+Peter%22">Kralicek, Peter</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Hansen%2C+Jan%22">Hansen, Jan</searchLink><relatesTo>3</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electromagnetic+Compatibility%22">IEEE Transactions on Electromagnetic Compatibility</searchLink>. Dec2017, Vol. 59 Issue 6, p1781-1790. 10p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Immunity+testing+%28Electronics%29%22">Immunity testing (Electronics)</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+control%22">Electronic control</searchLink><br /><searchLink fieldCode="DE" term="%22Electromagnetic+testing%22">Electromagnetic testing</searchLink><br /><searchLink fieldCode="DE" term="%22Huygens'+principle%22">Huygens' principle</searchLink><br /><searchLink fieldCode="DE" term="%22Wave+theory+of+light%22">Wave theory of light</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: A novel procedure is developed to simulate radiated emission (RE) and immunity scenarios using a common approach for electronic control unit with complex wiring harness and terminations. This is possible by applying Huygens principle and Reciprocity theorem to the problem. A segmented approach is proposed to split the device under test into multiple segments, which converts the radiation problem to circuit simulation, in addition to reducing the requirement of computing resources. The proposed method is validated using measurements and also full-wave three-dimensional simulations for both RE and immunity test setups. [ABSTRACT FROM PUBLISHER]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of IEEE Transactions on Electromagnetic Compatibility is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=124764974
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TEMC.2017.2699480
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 10
        StartPage: 1781
    Subjects:
      – SubjectFull: Immunity testing (Electronics)
        Type: general
      – SubjectFull: Electronic control
        Type: general
      – SubjectFull: Electromagnetic testing
        Type: general
      – SubjectFull: Huygens' principle
        Type: general
      – SubjectFull: Wave theory of light
        Type: general
    Titles:
      – TitleFull: A Novel Segmentation Approach for Modeling of Radiated Emission and Immunity Test Setups.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Reddy, V. S.
      – PersonEntity:
          Name:
            NameFull: Kralicek, Peter
      – PersonEntity:
          Name:
            NameFull: Hansen, Jan
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 12
              Text: Dec2017
              Type: published
              Y: 2017
          Identifiers:
            – Type: issn-print
              Value: 00189375
          Numbering:
            – Type: volume
              Value: 59
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: IEEE Transactions on Electromagnetic Compatibility
              Type: main
ResultId 1