APA (7th ed.) Citation

He, M., Contreras, G. K., Tran, D., Winemberg, L., & Tehranipoor, M. (2017). Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25(9), 2602. https://doi.org/10.1109/TVLSI.2017.2704104

Chicago Style (17th ed.) Citation

He, Miao, Gustavo K. Contreras, Dat Tran, LeRoy Winemberg, and Mark Tehranipoor. "Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25, no. 9 (2017): 2602. https://doi.org/10.1109/TVLSI.2017.2704104.

MLA (9th ed.) Citation

He, Miao, et al. "Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 25, no. 9, 2017, p. 2602, https://doi.org/10.1109/TVLSI.2017.2704104.