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A multiresolution approach to orientation assignment in 3D electron microscopy of single particles

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Title: A multiresolution approach to orientation assignment in 3D electron microscopy of single particles
Authors: Sorzano, C.O.S.1,2,3 coss@cnb.uam.es, Jonić, S.2, El-Bez, C.4, Carazo, J.M.3, De Carlo, S.5, Thévenaz, P.2, Unser, M.2
Source: Journal of Structural Biology. Jun2004, Vol. 146 Issue 3, p381. 12p.
Subjects: Electron microscopy, Coulomb potential, Electric fields, Potential theory (Physics)
Abstract: Three-dimensional (3D) electron microscopy (3DEM) aims at the determination of the spatial distribution of the Coulomb potential of macromolecular complexes. The 3D reconstruction of a macromolecule using single-particle techniques involves thousands of 2D projections. One of the key parameters required to perform such a 3D reconstruction is the orientation of each projection image as well as its in-plane orientation. This information is unknown experimentally and must be determined using image-processing techniques. We propose the use of wavelets to match the experimental projections with those obtained from a reference 3D model. The wavelet decomposition of the projection images provides a framework for a multiscale matching algorithm in which speed and robustness to noise are gained. Furthermore, this multiresolution approach is combined with a novel orientation selection strategy. Results obtained from computer simulations as well as experimental data encourage the use of this approach. [Copyright &y& Elsevier]
Copyright of Journal of Structural Biology is the property of Academic Press Inc. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 12840220
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: A multiresolution approach to orientation assignment in 3D electron microscopy of single particles
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  Data: Three-dimensional (3D) electron microscopy (3DEM) aims at the determination of the spatial distribution of the Coulomb potential of macromolecular complexes. The 3D reconstruction of a macromolecule using single-particle techniques involves thousands of 2D projections. One of the key parameters required to perform such a 3D reconstruction is the orientation of each projection image as well as its in-plane orientation. This information is unknown experimentally and must be determined using image-processing techniques. We propose the use of wavelets to match the experimental projections with those obtained from a reference 3D model. The wavelet decomposition of the projection images provides a framework for a multiscale matching algorithm in which speed and robustness to noise are gained. Furthermore, this multiresolution approach is combined with a novel orientation selection strategy. Results obtained from computer simulations as well as experimental data encourage the use of this approach. [Copyright &y& Elsevier]
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  Data: <i>Copyright of Journal of Structural Biology is the property of Academic Press Inc. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.jsb.2004.01.006
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        Text: English
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              Text: Jun2004
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