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Analysis of phonon spectra of the ZnxCd1-x Te solid-solution

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Title: Analysis of phonon spectra of the ZnxCd1-x Te solid-solution
Authors: Polit, J.J.1 polijack@atena.univ.rzeszow.pl, Sheregii, E.M.1 sheregii@atena.univ.rzeszow.pl, Burattini, E.2,3, Marcelli, A.3, Guidi, M. Cestelli3,4, Calvani, P.4, Nucara, A.4, Piccinini, M.3,5, Kisiel, A.6 kisiel@castor.if.uj.edu.pl, Konior, J.6 konior@castor.if.uj.edu.pl, Sciesińska, E.7, Sciesiński, J.7, Mycielski, A.8
Source: Journal of Alloys & Compounds. May2004, Vol. 371 Issue 1/2, p172-176. 5p.
Subjects: Semiconductors, Crystal growth, Light absorption, Crystals
Abstract: The optical reflectivity in the far infrared region (FIR spectra) was measured for five samples of ZnxCd1-xTe in the Zn range 0.056 using the Hg-lamp as well as synchrotron radiation. The analysis of the two bands of FIR phonon spectra with subtle structure was performed on the basis of the five-configuration tetrahedron model of ternary compounds and the seven-axiom statistical strained-tetrahedral model of Robouch et al. [J. Alloys Comp. 340 (2002) 13]. The eight phonon mode oscillator parameters triplets {Sk, ωk, γk}k=1,8 are obtained using the fitting procedure that enables us to determine the three SOP parameters W1, W2, W3. Thus, the real local crystalline structure of ZnCdTe is defined. [Copyright &y& Elsevier]
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Database: Engineering Source
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