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Advanced characterization and in-situ growth monitoring of Cu(In,Ga)Se2 thin films and solar cells.

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Title: Advanced characterization and in-situ growth monitoring of Cu(In,Ga)Se2 thin films and solar cells.
Authors: Abou-Ras, D.1 daniel.abou-ras@helmholtz-berlin.de, Bär, M.1, Caballero, R.1, Gunder, R.1, Hages, C.1, Heinemann, M.D.1, Kaufmann, C.A.1, Krause, M.1, Levcenko, S.1, Mainz, R.1, Márquez, J.1, Nikolaeva, A.1, Redinger, A.1, Schäfer, N.1, Schorr, S.1, Stange, H.1, Unold, T.1, Wilks, R.G.1
Source: Solar Energy. Aug2018, Vol. 170, p102-112. 11p.
Subjects: Solar cells, Crystal growth, Copper, Metallic thin films, Helmholtz-Zentrum Berlin für Materialien und Energie, Electron microscopy
Abstract: The continuous improvement of Cu(In,Ga)Se 2 (CIGSe) solar cells relies considerably on advanced characterization of individual layers in the solar-cell stacks as well as of completed CIGSe devices. The present contribution provides an overview of corresponding efforts performed by various research groups at Helmholtz-Zentrum Berlin für Materialien und Energie GmbH. In-situ growth monitoring of CIGSe absorber layers by means of energy-dispersive X-ray spectrometry and light scattering is described, as well as structural analyses by means of X-ray and neutron diffraction. In addition, the characterization of surfaces and interfaces by soft X-ray and electron spectroscopy, the microscopic analysis by means of correlative electron microscopy, and optoelectronic characterization by optical spectroscopy are highlighted. The present contribution shows which substantial efforts in a research network are necessary in order to obtain deeper insight into materials properties and potentially limiting factors for the device performance, as well as to be able to control these factors during the solar-cell production. [ABSTRACT FROM AUTHOR]
Copyright of Solar Energy is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 131146945
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Advanced characterization and in-situ growth monitoring of Cu(In,Ga)Se2 thin films and solar cells.
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  Data: <searchLink fieldCode="AR" term="%22Abou-Ras%2C+D%2E%22">Abou-Ras, D.</searchLink><relatesTo>1</relatesTo><i> daniel.abou-ras@helmholtz-berlin.de</i><br /><searchLink fieldCode="AR" term="%22Bär%2C+M%2E%22">Bär, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Caballero%2C+R%2E%22">Caballero, R.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Gunder%2C+R%2E%22">Gunder, R.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Hages%2C+C%2E%22">Hages, C.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Heinemann%2C+M%2ED%2E%22">Heinemann, M.D.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Kaufmann%2C+C%2EA%2E%22">Kaufmann, C.A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Krause%2C+M%2E%22">Krause, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Levcenko%2C+S%2E%22">Levcenko, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Mainz%2C+R%2E%22">Mainz, R.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Márquez%2C+J%2E%22">Márquez, J.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Nikolaeva%2C+A%2E%22">Nikolaeva, A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Redinger%2C+A%2E%22">Redinger, A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Schäfer%2C+N%2E%22">Schäfer, N.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Schorr%2C+S%2E%22">Schorr, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Stange%2C+H%2E%22">Stange, H.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Unold%2C+T%2E%22">Unold, T.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Wilks%2C+R%2EG%2E%22">Wilks, R.G.</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="DE" term="%22Solar+cells%22">Solar cells</searchLink><br /><searchLink fieldCode="DE" term="%22Crystal+growth%22">Crystal growth</searchLink><br /><searchLink fieldCode="DE" term="%22Copper%22">Copper</searchLink><br /><searchLink fieldCode="DE" term="%22Metallic+thin+films%22">Metallic thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Helmholtz-Zentrum+Berlin+für+Materialien+und+Energie%22">Helmholtz-Zentrum Berlin für Materialien und Energie</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+microscopy%22">Electron microscopy</searchLink>
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  Data: The continuous improvement of Cu(In,Ga)Se 2 (CIGSe) solar cells relies considerably on advanced characterization of individual layers in the solar-cell stacks as well as of completed CIGSe devices. The present contribution provides an overview of corresponding efforts performed by various research groups at Helmholtz-Zentrum Berlin für Materialien und Energie GmbH. In-situ growth monitoring of CIGSe absorber layers by means of energy-dispersive X-ray spectrometry and light scattering is described, as well as structural analyses by means of X-ray and neutron diffraction. In addition, the characterization of surfaces and interfaces by soft X-ray and electron spectroscopy, the microscopic analysis by means of correlative electron microscopy, and optoelectronic characterization by optical spectroscopy are highlighted. The present contribution shows which substantial efforts in a research network are necessary in order to obtain deeper insight into materials properties and potentially limiting factors for the device performance, as well as to be able to control these factors during the solar-cell production. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Solar Energy is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.solener.2018.04.032
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