Kamble, S. S., Radhakrishnan, J. K., & Krishnamoorthy, R. (2018). Effect of O2 flow rate on the characteristics of ZnO thin films deposited by RF reactive magnetron sputtering. Materials Technology, 33(11), 709. https://doi.org/10.1080/10667857.2018.1497834
Chicago Style (17th ed.) CitationKamble, Sudhir S., J. K. Radhakrishnan, and Rajavel Krishnamoorthy. "Effect of O2 Flow Rate on the Characteristics of ZnO Thin Films Deposited by RF Reactive Magnetron Sputtering." Materials Technology 33, no. 11 (2018): 709. https://doi.org/10.1080/10667857.2018.1497834.
MLA (9th ed.) CitationKamble, Sudhir S., et al. "Effect of O2 Flow Rate on the Characteristics of ZnO Thin Films Deposited by RF Reactive Magnetron Sputtering." Materials Technology, vol. 33, no. 11, 2018, p. 709, https://doi.org/10.1080/10667857.2018.1497834.